DB HiTek enhance its global shutter and SPAD process technologies

“We plan to enhance customer support by providing services such as customised processes, TDK for pixel development simulations, as well as multi-layer mask (MLM).”

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DB HiTek is set to develop its global shutter and single-photon avalanche diode (SPAD) process technologies. Both solutions are increasingly popular in the automotive, industrial, robotics, and medical sectors. The foundry specialist hopes that the planned enhancements will further establish the company in the image sensor sector.

Global shutters are sensors that are used to capture images of fast-moving objects without distortion negatively impacting the image quality. Demand for shutters is increasing, especially in the machine vision, automotive, drones, robotics, and medical device industries. There is a forecasted average market growth rate of 16% from 2022 to 2029 in this sector.

Parasitic light sensitivity (PLS) is used to indicate the sensitivity levels to light. Having a PSL of 10,000 or more demonstrates a shutter efficiency level that achieves a light detection rate of 99.99%. Relating this to DB HiTek’s technology:

  • The DB HiTek 7 Tr global shutter achieves PLS≥35,000 at 5.6 um pixels (using light shield and light guide technologies) and supports sizes down to 2.8 um pixels (PLS≥10,000).
  • The DB HiTek 6 Tr global shutter has PLS ≥10,000 and a memory dark current ≤20e/s at 60C in the 2.8 μm pixel.

Whereas SPAD is an ultra-sensitive 3D image sensor which can detect weak light signals at the particle level. The solution can provide high precision levels and perform long-distance measurements. According to the South Korean company, these results make SPAD an ideal solution for advanced technologies like autonomous vehicles, AR/VR devices, robotics, and smartphones.

The second generation of DB HiTek’s SPAD technology utilises a backside scattering technology (BST) and backside deep trench isolation (BDTI) in a BSI structure. This allows the solution to achieve a photon detection probability of 15.8% at a wavelength of 940 nm. Quality assurance is also achieved by securing a dark current rate (DCR) performance equivalent to 0.69 cps/um2. 

 “Currently, our company is collaborating with leading global companies in the United States, Europe, China, Japan, and other regions to develop products,” commented a DB HiTek official. “We plan to enhance customer support by providing services such as customised processes, TDK for pixel development simulations, as well as a multi-layer mask (MLM).”