4D Technology's AccuFiz Duo
4D Technology, a subsidiary of Onto Innovation, has unveiled its new AccuFiz Duo Fizeau interferometer. The new solution builds upon the AccuFiz D short coherence capabilities by adding long coherence capabilities and combining both into one system.
AccuFiz Duo short coherence mode
Utilising the AccuFiz D short coherence capabilities, the AccuFiz Duo allows for the vibration-insensitive, on-axis, dynamic measurements with high levels of accuracy of optical grade surfaces. Additionally, the system can measure flats and lenses without coating the surface to attenuate extraneous interference fringes.
Boosting quality assurance, this mode can detect surface errors, transmitted wavefront errors, remote cavities, wedges, optical thickness, and homogeneity measurements of plane parallel transparent surfaces down to 0.2 mm thick.
AccuFiz Duo long coherence mode
4D Technology’s new solution uses a stabilised HeNe laser which provides the same benefits as a standard phase-shifting Fizeau interferometer. With the addition of this mode, AccuFiz Duo offers very long cavity measurements and is also useful for standard radius of curvature measurements.
With the spatial carrier dynamic mode, the system can also enable an option for vibration and turbulence mitigation. Digital hologram measurements can also be completed with the 632.8nm HeNe source.
“We are excited to introduce this new offering to the optics community,” said Erik Novak, Vice President and General Manager of 4D Technology. “The AccuFiz Duo provides customers who are challenged with vibration and turbulence with a novel and modular dynamic system to enable them to measure a broader range of optics in a single system, saving on space and cost.”
Like the AccuFiz D, the latest model offers a compact, lightweight design but with a wider measurement range. 4D Technology’s 4Sight Focus analysis software can be used in both modes. According to the surface metrology specialist, “2D and 3D displays, filtering, and masking tools make it simple to quantify key surface shape; and Zernike, Seidel, geometric and diffraction analyses are all easy to perform.”