ZEISS
ZEISS VersaXRM 730.
ZEISS has launched its latest X-ray microscopy solution, the ZEISS VersaXRM 730. Designed to offer enhanced levels of performance, choice, and accessibility, the new system provides faster throughput and time-to-results to improve productivity levels.
The VersaXRM 730 comes equipped with the ZEN navx guidance and control system, which makes the solution easier to use for users of all skill levels. One-minute tomographies are possible with the FAST MODE, speeding up 3D imaging applications. FAST MODE provides real-time 3D navigation with Volume Scout workflow integration via ZEN navx. The system also provides built-in guidance, automated workflows, and intelligent system insights.
Additionally, the navx system has built-in SmartShield protection. While the ZEN navx File Transfer Utility (FTU) allows the user to automatically transfer data from the microscope to other locations.
“Successful 3D X-ray microscopy requires efficient exploration, precise feature targeting, and powerful capabilities to enable new discoveries. With new, patented technologies wrapped in an award-winning software environment, ZEISS VersaXRM 730 delivers synergistic performance that is truly more than the sum of its parts,” said Martin Fischer, Head of Global Sales and Service at ZEISS. “We’ve capitalised on the most proven and versatile XRM platform, representing our commitment to excellence and once again advancing the field of 3D X-ray microscopy.”
Key features of the ZEISS VersaXRM 730:
- Equipped with the ZEN navx guidance and control system, providing improved usability to increase productivity.
- Leverages artificial intelligence (AI) technologies.
- Optional flat panel extension (FPX) can increase versatility with the FAST MODE.
- One-minute tomographies are possible with FAST MODE.
- With ZEN navx FTU, users can automatically transfer data from the microscope to other locations.
- Includes DeepRecon Pro, a module from the Advanced Reconstruction Toolkit.
A wide range of sample sizes and types can be studied efficiently and accurately with the high-resolution 40x-Prime detector with 450 nm spatial resolution.
“The new navx software has been instrumental in improving workflows for acquiring 3D datasets,” said Professor André Phillion from the Department of Materials Science and Engineering at McMaster University, Ontario, Canada. “Due to the safety and built-in sample knowledge, we find it especially useful when training young researchers to be independent system users. It has also helped to reduce the time needed for setting up a sample run.”