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Park Systems' Park FX200.
Park FX200
Park Systems has unveiled its latest atomic force microscopy (AFM) innovation, the Park FX200. Designed to be used in both research and industrial applications, the new system can be used for 200 mm samples to provide significant advancements in large-sample AFM technology.
The FX200 platform includes a wide range of new automated features to improve efficiency and streamline operations, which will boost productivity levels. For example, the user will no longer need to make manual adjustments with automatic probe recognition. Additionally, the reduced laser spot size and automatic alignments will also boost accuracy and consistency during measurement processes.
Key features of the Park FX200:
- Advanced mechanical structure ensuring a lower noise floor and minimal thermal drift.
- Improved stability during measurement processes allows for greater accuracy and reliability.
- Rapid and precise scanning with faster Z servo performance.
- Autofocus provides a high-power sample view, allowing the user to achieve improved levels of clarity and detail in AFM imaging.
- Optics provides a full 200 mm sample view for comprehensive analysis without needing to stitch multiple images together.
- Automatic scan parameter settings.
The enhanced performance capabilities of the FX200 allow the system to be used in various research and industrial applications as it offers “enhanced precision, automated efficiency, and comprehensive sample visualisation.”