Hamed Sadeghian on LinkedIn
Nearfield Instruments' QUADRA metrology system.
Nearfield Instruments has announced that it has secured a purchase order for its QUARDA metrology systems. A “major” semiconductor manufacturing fab located in Asia is the recipient of said order, which will see the company gain a high-throughput atomic force microscopy (AFM) metrology system.
The device can provide in-line, on-device, non-destructive three-dimensional (3D) metrology. By utilising this technology, the user can speed up its time to yield and optimise its high-volume manufacturing (HVM) yield.
Additionally, the metrology and process control equipment manufacturer also sold its Lightning Mode feature which is compatible with the QUADRA system. The newly launched feature aims to boost productivity and throughput while also enhancing Nearfield’s proprietary imagining algorithm and data analysis software. The latter will help the user address process challenges by minimising geometries, complex 3D structuring, and advanced packaging for High Bandwidth Memory (HBM).
“We are delighted to receive this order from a world-leading advanced fab in Asia, which continues to ramp aggressively to meet the growing demand for advanced devices such as HBM that enable AI applications,” said Hamed Sadeghian, CEO of Nearfield Instruments. “We are proud that our process control solutions address the challenging requirements of semiconductor manufacturing of advanced devices as well as of future angstrom-level nodes. With our fast time-to-solution and non-destructive systems we are committed to contributing to greener semiconductor fabs.”