ClassOne Equipment delivers new particle measurement system to metrology EUV chip manufacturer EUV Tech

"A key factor in our selecting the new 300mm Takano WM-10 system was its very high-sensitivity particle detection."

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Semiconductor processing equipment provider ClassOne Equipment has delivered its new particle measurement system to metrology equipment EUV chip manufacturer EUV Tech. The Takano WM-10 will provide high-sensitivity particle detection, with ClassOne hoping to replace the Surfscan systems, which is considered the current industry standard.

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In addition to the increased detection sensitivity, the Takano WM-10 will also provide high throughput, reliability, and repeatability, as well as a suite of options. With ClassOne competitively pricing its new system, with a high level of availability for potential customers. 

“A key factor in our selecting the new 300mm Takano WM-10 system was its very high-sensitivity particle detection,” said Matt Hettermann, EUV Tech Vice President of R&D. “For us, particle sensitivity is critical because we are using the new Takano tool to validate the cleanliness of the equipment we build – which are some of the most advanced EUV and soft x-ray systems in the industry.”

“We have the new WM-10 running in our fab in Martinez, California,” added Hettermann. “And we’re already seeing the outstanding performance it delivers – routinely detecting particles down to 48nm. Plus, it’s configured to handle not only 300mm wafers but also 200mm and 150mm.”

ClassOne also offers a variety of previously owned semiconductors, as well as thousands of top-quality OEM parts, equipment service, support, warranties, financing, and more. The American company is the exclusive source of service, sales, and support of Takano-brand particle detection systems across Europe and North America. Also, ClassOne provides a team of specially trained field engineers to provide services including, PMs and installations on Takano systems.

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